NIST/non-linear/Thurber.dat

0001 NIST/ITL StRD
0002 Dataset Name:  Thurber           (Thurber.dat)
0003
0004 File Format:   ASCII
0005                Starting Values   (lines 41 to 47)
0006                Certified Values  (lines 41 to 52)
0007                Data              (lines 61 to 97)
0008
0009 Procedure:     Nonlinear Least Squares Regression
0010
0011 Description:   These data are the result of a NIST study involving
0012                semiconductor electron mobility.  The response
0013                variable is a measure of electron mobility, and the
0014                predictor variable is the natural log of the density.
0015
0016
0017 Reference:     Thurber, R., NIST (197?).
0018                Semiconductor electron mobility modeling.
0019
0020
0021
0022
0023
0024
0025 Data:          1 Response Variable  (y = electron mobility)
0026                1 Predictor Variable (x = log[density])
0027                37 Observations
0028                Higher Level of Difficulty
0029                Observed Data
0030
0031 Model:         Rational Class (cubic/cubic)
0032                7 Parameters (b1 to b7)
0033
0034                y = (b1 + b2*x + b3*x**2 + b4*x**3) /
0035                    (1 + b5*x + b6*x**2 + b7*x**3)  +  e
0036
0037
0038           Starting Values                  Certified Values
0039
0040         Start 1     Start 2           Parameter     Standard Deviation
0041   b1 =   1000        1300          1.2881396800E+03  4.6647963344E+00
0042   b2 =   1000        1500          1.4910792535E+03  3.9571156086E+01
0043   b3 =    400         500          5.8323836877E+02  2.8698696102E+01
0044   b4 =     40          75          7.5416644291E+01  5.5675370270E+00
0045   b5 =      0.7         1          9.6629502864E-01  3.1333340687E-02
0046   b6 =      0.3         0.4        3.9797285797E-01  1.4984928198E-02
0047   b7 =      0.03        0.05       4.9727297349E-02  6.5842344623E-03
0048
0049 Residual Sum of Squares:                    5.6427082397E+03
0050 Residual Standard Deviation:                1.3714600784E+01
0051 Degrees of Freedom:                                30
0052 Number of Observations:                            37
0053
0054
0055
0056
0057
0058
0059
0060 Data:   y             x
0061       80.574E0      -3.067E0
0062       84.248E0      -2.981E0
0063       87.264E0      -2.921E0
0064       87.195E0      -2.912E0
0065       89.076E0      -2.840E0
0066       89.608E0      -2.797E0
0067       89.868E0      -2.702E0
0068       90.101E0      -2.699E0
0069       92.405E0      -2.633E0
0070       95.854E0      -2.481E0
0071      100.696E0      -2.363E0
0072      101.060E0      -2.322E0
0073      401.672E0      -1.501E0
0074      390.724E0      -1.460E0
0075      567.534E0      -1.274E0
0076      635.316E0      -1.212E0
0077      733.054E0      -1.100E0
0078      759.087E0      -1.046E0
0079      894.206E0      -0.915E0
0080      990.785E0      -0.714E0
0081     1090.109E0      -0.566E0
0082     1080.914E0      -0.545E0
0083     1122.643E0      -0.400E0
0084     1178.351E0      -0.309E0
0085     1260.531E0      -0.109E0
0086     1273.514E0      -0.103E0
0087     1288.339E0       0.010E0
0088     1327.543E0       0.119E0
0089     1353.863E0       0.377E0
0090     1414.509E0       0.790E0
0091     1425.208E0       0.963E0
0092     1421.384E0       1.006E0
0093     1442.962E0       1.115E0
0094     1464.350E0       1.572E0
0095     1468.705E0       1.841E0
0096     1447.894E0       2.047E0
0097     1457.628E0       2.200E0